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Information card for entry 4065160
Preview
| Coordinates | 4065160.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H82 K N3 Si3 W |
|---|---|
| Calculated formula | C36 H82 K N3 Si3 W |
| SMILES | [WH](=N[Si](C(C)(C)C)(C(C)(C)C)C(C)(C)C)(=N[Si](C(C)(C)C)(C(C)(C)C)C(C)(C)C)=N[Si](C(C)(C)C)(C(C)(C)C)C(C)(C)C.[K+] |
| Title of publication | Reactivity Studies of (tBu3SiNH)(tBu3SiN═)2WH Including Anionic Derivatives Featuring the Tris-tri-tert-butylsilylimide Tungsten Core |
| Authors of publication | Schafer, Daniel F.; Wolczanski, Peter T.; Lobkovsky, Emil B. |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 24 |
| Pages of publication | 6539 |
| a | 12.941 ± 0.001 Å |
| b | 13.103 ± 0.001 Å |
| c | 16.293 ± 0.001 Å |
| α | 70.85 ± 0.04° |
| β | 71.47 ± 0.04° |
| γ | 62.55 ± 0.03° |
| Cell volume | 2269.8 ± 0.8 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0671 |
| Residual factor for significantly intense reflections | 0.0581 |
| Weighted residual factors for all reflections | 0.1661 |
| Weighted residual factors for significantly intense reflections | 0.15 |
| Goodness-of-fit parameter for all reflections | 1.041 |
| Goodness-of-fit parameter for significantly intense reflections | 1.037 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4065160.html
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Users of the data should acknowledge the original authors of the
structural data.