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Information card for entry 4065220
Preview
| Coordinates | 4065220.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C29 H28 Cl2 Fe N O3 P Pd S |
|---|---|
| Calculated formula | C29 H28 Cl2 Fe N O3 P Pd S |
| SMILES | [Fe]12345678([cH]9[cH]1[cH]2[cH]3[cH]49)[c]12[cH]5[cH]6[cH]7[c]81S(=O)(=O)O[Pd]([n]1ccccc1)(C)[P]2(c1ccccc1)c1ccccc1.C(Cl)Cl |
| Title of publication | o-Diarylphosphinoferrocene Sulfonate Palladium Systems for Nonalternating Ethene‒Carbon Monoxide Copolymerization |
| Authors of publication | Chen, Chao; Anselment, Timo M. J.; Fröhlich, Roland; Rieger, Bernhard; Kehr, Gerald; Erker, Gerhard |
| Journal of publication | Organometallics |
| Year of publication | 2011 |
| Journal volume | 30 |
| Journal issue | 19 |
| Pages of publication | 5248 |
| a | 17.8906 ± 0.0007 Å |
| b | 9.3517 ± 0.0005 Å |
| c | 17.9434 ± 0.0008 Å |
| α | 90° |
| β | 102.814 ± 0.002° |
| γ | 90° |
| Cell volume | 2927.3 ± 0.2 Å3 |
| Cell temperature | 223 ± 2 K |
| Ambient diffraction temperature | 223 ± 2 K |
| Number of distinct elements | 9 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.112 |
| Residual factor for significantly intense reflections | 0.0767 |
| Weighted residual factors for significantly intense reflections | 0.1711 |
| Weighted residual factors for all reflections included in the refinement | 0.1905 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4065220.html
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Users of the data should acknowledge the original authors of the
structural data.