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Information card for entry 4067796
Preview
| Coordinates | 4067796.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C49 H57 Co |
|---|---|
| Calculated formula | C49 H57 Co |
| SMILES | [Co]1234567([C]8(=[C]1([C]2(=[C]38c1ccc(cc1)CCCC)c1ccc(cc1)CCCC)c1ccc(cc1)CCCC)c1ccc(cc1)CCCC)[cH]1[cH]4[cH]5[cH]6[cH]71 |
| Title of publication | An Improved Protocol for the Synthesis of [(η4-C4R4)Co(η5-C5H5)] Complexes |
| Authors of publication | Bertrand, Guillaume; Tortech, Ludovic; Fichou, Denis; Malacria, Max; Aubert, Corinne; Gandon, Vincent |
| Journal of publication | Organometallics |
| Year of publication | 2012 |
| Journal volume | 31 |
| Journal issue | 1 |
| Pages of publication | 126 |
| a | 10.7152 ± 0.0003 Å |
| b | 11.6509 ± 0.0004 Å |
| c | 17.0103 ± 0.0005 Å |
| α | 79.647 ± 0.001° |
| β | 71.889 ± 0.002° |
| γ | 89.139 ± 0.001° |
| Cell volume | 1983.63 ± 0.11 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0725 |
| Residual factor for significantly intense reflections | 0.0558 |
| Weighted residual factors for significantly intense reflections | 0.1453 |
| Weighted residual factors for all reflections included in the refinement | 0.1584 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4067796.html
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Users of the data should acknowledge the original authors of the
structural data.