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Information card for entry 4067995
Preview
| Coordinates | 4067995.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C33 H45 Br O P2 Pd |
|---|---|
| Calculated formula | C33 H45 Br O P2 Pd |
| SMILES | Br[Pd]1(c2ccccc2)[P](c2c3c(ccc2)C(c2cccc(c2O3)[P]1(C(C)C)C(C)C)(C)C)(C(C)C)C(C)C |
| Title of publication | CF3‒Ph Reductive Elimination from [(Xantphos)Pd(CF3)(Ph)] |
| Authors of publication | Bakhmutov, Vladimir I.; Bozoglian, Fernando; Gómez, Kerman; González, Gabriel; Grushin, Vladimir V.; Macgregor, Stuart A.; Martin, Eddy; Miloserdov, Fedor M.; Novikov, Maxim A.; Panetier, Julien A.; Romashov, Leonid V. |
| Journal of publication | Organometallics |
| Year of publication | 2012 |
| Journal volume | 31 |
| Journal issue | 4 |
| Pages of publication | 1315 |
| a | 10.8847 ± 0.0004 Å |
| b | 16.2766 ± 0.0005 Å |
| c | 18.3614 ± 0.0006 Å |
| α | 90° |
| β | 95.684 ± 0.002° |
| γ | 90° |
| Cell volume | 3237.02 ± 0.19 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0552 |
| Residual factor for significantly intense reflections | 0.0383 |
| Weighted residual factors for significantly intense reflections | 0.0888 |
| Weighted residual factors for all reflections included in the refinement | 0.0989 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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structural data.