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Information card for entry 4069016
Preview
| Coordinates | 4069016.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H33 I N3 O P2 Rh S2 |
|---|---|
| Calculated formula | C32 H33 I N3 O P2 Rh S2 |
| SMILES | C1(=N\CC)/[P+](c2ccccc2)(c2ccccc2)N2[P+](/C(=N/CC)S[Rh]2(C(=O)C)(I)S1)(c1ccccc1)c1ccccc1 |
| Title of publication | Oxidative Addition of Iodomethane to Charge-Tuned Rhodium(I)Complexes |
| Authors of publication | Delferro, Massimiliano; Tegoni, Matteo; Verdolino, Vincenzo; Cauzzi, Daniele; Graiff, Claudia; Tiripicchio, Antonio |
| Journal of publication | Organometallics |
| Year of publication | 2009 |
| Journal volume | 28 |
| Journal issue | 7 |
| Pages of publication | 2062 |
| a | 10.2202 ± 0.001 Å |
| b | 17.1021 ± 0.0017 Å |
| c | 19.943 ± 0.002 Å |
| α | 90° |
| β | 99.151 ± 0.002° |
| γ | 90° |
| Cell volume | 3441.4 ± 0.6 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.067 |
| Residual factor for significantly intense reflections | 0.0372 |
| Weighted residual factors for significantly intense reflections | 0.0902 |
| Weighted residual factors for all reflections included in the refinement | 0.0998 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.91 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4069016.html
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