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Information card for entry 4069120
Preview
| Coordinates | 4069120.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H25 Cl N P Pd |
|---|---|
| Calculated formula | C22 H25 Cl N P Pd |
| SMILES | [Pd]1(Cl)([P](CCc2[n]1cccc2)(c1c(cccc1)C)c1c(cccc1)C)C |
| Title of publication | Nickel and Palladium Complexes of New Pyridine-Phosphine Ligands and Their Use in Ethene Oligomerization |
| Authors of publication | Flapper, Jitte; Kooijman, Huub; Lutz, Martin; Spek, Anthony L.; van Leeuwen, Piet W. N. M.; Elsevier, Cornelis J.; Kamer, Paul C. J. |
| Journal of publication | Organometallics |
| Year of publication | 2009 |
| Journal volume | 28 |
| Journal issue | 11 |
| Pages of publication | 3272 |
| a | 8.6654 ± 0.001 Å |
| b | 11.1373 ± 0.001 Å |
| c | 12.839 ± 0.002 Å |
| α | 74.356 ± 0.015° |
| β | 73.078 ± 0.015° |
| γ | 68.916 ± 0.018° |
| Cell volume | 1087 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0256 |
| Residual factor for significantly intense reflections | 0.0223 |
| Weighted residual factors for significantly intense reflections | 0.0562 |
| Weighted residual factors for all reflections included in the refinement | 0.0573 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4069120.html
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Users of the data should acknowledge the original authors of the
structural data.