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Information card for entry 4069475
Preview
| Coordinates | 4069475.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [SiPPh3]RuPPh2 |
|---|---|
| Formula | C70.5 H62.5 Cl O P4 Ru Si |
| Calculated formula | C70.5 H62.5 Cl O P4 Ru Si |
| SMILES | [Ru]123([Si](c4ccccc4[P]1(c1ccccc1)c1ccccc1)(c1ccccc1[P]2(c1ccccc1)c1ccccc1)c1ccccc1[P]3(c1ccccc1)c1ccccc1)P(c1ccccc1)c1ccccc1.CCOCC.ClCCl |
| Title of publication | E-H Bond Activation Reactions (E = H, C, Si, Ge) at Ruthenium: Terminal Phosphides, Silylenes, and Germylenes |
| Authors of publication | Takaoka, Ayumi; Mendiratta, Arjun; Peters, Jonas C. |
| Journal of publication | Organometallics |
| Year of publication | 2009 |
| Journal volume | 28 |
| Journal issue | 13 |
| Pages of publication | 3744 |
| a | 16.2531 ± 0.0017 Å |
| b | 17.6119 ± 0.0018 Å |
| c | 40.998 ± 0.004 Å |
| α | 90° |
| β | 96.838 ± 0.002° |
| γ | 90° |
| Cell volume | 11652 ± 2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0879 |
| Residual factor for significantly intense reflections | 0.0586 |
| Weighted residual factors for significantly intense reflections | 0.1404 |
| Weighted residual factors for all reflections included in the refinement | 0.159 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.077 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4069475.html
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Users of the data should acknowledge the original authors of the
structural data.