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Information card for entry 4072230
Preview
| Coordinates | 4072230.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H45 Ti |
|---|---|
| Calculated formula | C30 H45 Ti |
| SMILES | [Ti]123456789([c]%10([c]1([c]2([c]3([c]4%10C)C)C)C)CC(=C9C(=C)CCC)CCC)[c]1([c]8([c]7([c]6([c]51C)C)C)C)C |
| Title of publication | Insertion of Internal Alkynes and Ethene into Permethylated Singly Tucked-in Titanocene |
| Authors of publication | Pinkas, J.; Císařová, I.; Gyepes, R.; Horáček, M.; Kubišta, J.; Čejka, J.; Gómez-Ruiz, S.; Hey-Hawkins, E.; Mach, K. |
| Journal of publication | Organometallics |
| Year of publication | 2008 |
| Journal volume | 27 |
| Journal issue | 21 |
| Pages of publication | 5532 |
| a | 14.953 ± 0.0007 Å |
| b | 17.0466 ± 0.0004 Å |
| c | 21.464 ± 0.0009 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5471.1 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.154 |
| Residual factor for significantly intense reflections | 0.0674 |
| Weighted residual factors for significantly intense reflections | 0.1521 |
| Weighted residual factors for all reflections included in the refinement | 0.1883 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4072230.html
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Users of the data should acknowledge the original authors of the
structural data.