Information card for entry 4072233
| Formula |
C34 H53 Si Ti |
| Calculated formula |
C34 H53 Si Ti |
| Title of publication |
Insertion of Internal Alkynes and Ethene into Permethylated Singly Tucked-in Titanocene |
| Authors of publication |
Pinkas, J.; Císařová, I.; Gyepes, R.; Horáček, M.; Kubišta, J.; Čejka, J.; Gómez-Ruiz, S.; Hey-Hawkins, E.; Mach, K. |
| Journal of publication |
Organometallics |
| Year of publication |
2008 |
| Journal volume |
27 |
| Journal issue |
21 |
| Pages of publication |
5532 |
| a |
29.3847 ± 0.0002 Å |
| b |
11.9628 ± 0.0001 Å |
| c |
18.7935 ± 0.0003 Å |
| α |
90° |
| β |
108.441 ± 0.0005° |
| γ |
90° |
| Cell volume |
6267.11 ± 0.12 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0639 |
| Residual factor for significantly intense reflections |
0.0486 |
| Weighted residual factors for significantly intense reflections |
0.1169 |
| Weighted residual factors for all reflections included in the refinement |
0.1247 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.063 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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