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Information card for entry 4073490
Preview
| Coordinates | 4073490.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H34 Te U |
|---|---|
| Calculated formula | C26 H34 Te U |
| SMILES | [U]123456789(c%10ccccc%10[Te]1)([c]1([c]2([c]3([c]4([c]51C)C)C)C)C)[c]1([c]6([c]7([c]8([c]91C)C)C)C)C |
| Title of publication | Formation of (C5Me5)2U(EPh)Me, (C5Me5)2U(EPh)2, and (C5Me5)2U(η2-TeC6H4) from (C5Me5)2UMe2and PhEEPh (E = S, Se, Te) |
| Authors of publication | Evans, William J.; Miller, Kevin A.; Ziller, Joseph W.; DiPasquale, Antonio G.; Heroux, Katie J.; Rheingold, Arnold L. |
| Journal of publication | Organometallics |
| Year of publication | 2007 |
| Journal volume | 26 |
| Journal issue | 17 |
| Pages of publication | 4287 |
| a | 8.4434 ± 0.0013 Å |
| b | 16.064 ± 0.003 Å |
| c | 17.729 ± 0.003 Å |
| α | 90° |
| β | 93.046 ± 0.002° |
| γ | 90° |
| Cell volume | 2401.3 ± 0.7 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0279 |
| Residual factor for significantly intense reflections | 0.0238 |
| Weighted residual factors for significantly intense reflections | 0.0608 |
| Weighted residual factors for all reflections included in the refinement | 0.0621 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4073490.html
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Users of the data should acknowledge the original authors of the
structural data.