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Information card for entry 4073563
Preview
| Coordinates | 4073563.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C58 H62 Cl4 F2 P2 Pd2 |
|---|---|
| Calculated formula | C58 H62 Cl4 F2 P2 Pd2 |
| SMILES | c1(ccc(cc1)C)[Pd]1([F][Pd]([F]1)(c1ccc(cc1)C)[P](c1ccccc1C)(c1ccccc1C)c1c(cccc1)C)[P](c1ccccc1C)(c1ccccc1C)c1c(cccc1)C.C(Cl)Cl.C(Cl)Cl |
| Title of publication | Ar−F Reductive Elimination from Palladium(II) Revisited† |
| Authors of publication | Grushin, Vladimir V.; Marshall, William J. |
| Journal of publication | Organometallics |
| Year of publication | 2007 |
| Journal volume | 26 |
| Journal issue | 20 |
| Pages of publication | 4997 |
| a | 29.772 ± 0.009 Å |
| b | 13.907 ± 0.004 Å |
| c | 17.997 ± 0.006 Å |
| α | 90° |
| β | 124.594 ± 0.005° |
| γ | 90° |
| Cell volume | 6134 ± 3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0807 |
| Residual factor for significantly intense reflections | 0.0524 |
| Weighted residual factors for significantly intense reflections | 0.1436 |
| Weighted residual factors for all reflections included in the refinement | 0.1601 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4073563.html
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