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Information card for entry 4073658
Preview
| Coordinates | 4073658.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H40 Bi F6 P3 |
|---|---|
| Calculated formula | C48 H40 Bi F6 P3 |
| SMILES | [Bi](=P(c1ccccc1)(c1ccccc1)c1ccccc1)([P+](c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1.[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Triphenylphosphine-Stabilized Diphenyl-Arsenium, -Stibenium, and -Bismuthenium Salts |
| Authors of publication | Kilah, Nathan L.; Petrie, Simon; Stranger, Robert; Wielandt, J. Wolfram; Willis, Anthony C.; Wild, S. Bruce |
| Journal of publication | Organometallics |
| Year of publication | 2007 |
| Journal volume | 26 |
| Journal issue | 25 |
| Pages of publication | 6106 |
| a | 13.6442 ± 0.0003 Å |
| b | 14.6791 ± 0.0004 Å |
| c | 21.3363 ± 0.0004 Å |
| α | 90° |
| β | 92.0761 ± 0.0014° |
| γ | 90° |
| Cell volume | 4270.53 ± 0.17 Å3 |
| Cell temperature | 200 K |
| Ambient diffraction temperature | 200 K |
| Number of distinct elements | 5 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.064 |
| Residual factor for significantly intense reflections | 0.0447 |
| Weighted residual factors for all reflections | 0.0849 |
| Weighted residual factors for significantly intense reflections | 0.0511 |
| Weighted residual factors for all reflections included in the refinement | 0.0511 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.113 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4073658.html
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Users of the data should acknowledge the original authors of the
structural data.