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Information card for entry 4074236
Preview
| Coordinates | 4074236.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H22 Co4 O13 Si2 |
|---|---|
| Calculated formula | C32 H22 Co4 O13 Si2 |
| SMILES | [C]12([Co]3(C#[O])(C#[O])(C#[O])[Co]1(C#[O])([C]=23c1ccccc1)(C#[O])C#[O])[Si](O[Si]([C]12=[C]3(c4ccccc4)[Co]1(C#[O])(C#[O])(C#[O])[Co]23(C#[O])(C#[O])C#[O])(C)C)(C)C |
| Title of publication | Cobalt-Assisted Silicon−Silicon Bond Activation |
| Authors of publication | Zirngast, Michaela; Marschner, Christoph; Baumgartner, Judith |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 20 |
| Pages of publication | 4897 |
| a | 28.608 ± 0.006 Å |
| b | 9.0551 ± 0.0018 Å |
| c | 15.553 ± 0.003 Å |
| α | 90° |
| β | 113.67 ± 0.03° |
| γ | 90° |
| Cell volume | 3690 ± 1.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0786 |
| Residual factor for significantly intense reflections | 0.0711 |
| Weighted residual factors for significantly intense reflections | 0.1414 |
| Weighted residual factors for all reflections included in the refinement | 0.1446 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.314 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4074236.html
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Users of the data should acknowledge the original authors of the
structural data.