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Information card for entry 4074535
Preview
| Coordinates | 4074535.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H32 Al Cl2 N Si3 |
|---|---|
| Calculated formula | C12 H32 Al Cl2 N Si3 |
| SMILES | [Al]1(Cl)(Cl)[N](C[Si](C1([Si](C)(C)C)[Si](C)(C)C)(C)C)(C)C |
| Title of publication | [1]Ferrocenophanes, [1]Chromarenophanes, and [1]Vanadarenophanes with Aluminium and Gallium in Bridging Positions |
| Authors of publication | Lund, Clinton L.; Schachner, Jörg A.; Quail, J. Wilson; Müller, Jens |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 24 |
| Pages of publication | 5817 |
| a | 14.5558 ± 0.0002 Å |
| b | 10.5318 ± 0.0002 Å |
| c | 14.0477 ± 0.0002 Å |
| α | 90° |
| β | 101.332 ± 0.0012° |
| γ | 90° |
| Cell volume | 2111.51 ± 0.06 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0452 |
| Residual factor for significantly intense reflections | 0.034 |
| Weighted residual factors for significantly intense reflections | 0.0829 |
| Weighted residual factors for all reflections included in the refinement | 0.0886 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4074535.html
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