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Information card for entry 4074862
Preview
| Coordinates | 4074862.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H45 N Ni P2 |
|---|---|
| Calculated formula | C28 H45 N Ni P2 |
| SMILES | [Ni]12([P](C(C)C)(C(C)C)c3ccccc3N2c2ccccc2[P]1(C(C)C)C(C)C)CCCC |
| Title of publication | Amido Pincer Complexes of Nickel(II): Synthesis, Structure, and Reactivity |
| Authors of publication | Liang, Lan-Chang; Chien, Pin-Shu; Lin, Jia-Ming; Huang, Mei-Hui; Huang, Yu-Lun; Liao, Ju-Hsiou |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 6 |
| Pages of publication | 1399 - 1411 |
| a | 18.084 ± 0.0003 Å |
| b | 8.585 ± 0.0002 Å |
| c | 19.323 ± 0.0004 Å |
| α | 90° |
| β | 107.576 ± 0.001° |
| γ | 90° |
| Cell volume | 2859.87 ± 0.1 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/a 1 |
| Hall space group symbol | -P 2yab |
| Residual factor for all reflections | 0.0804 |
| Residual factor for significantly intense reflections | 0.0532 |
| Weighted residual factors for significantly intense reflections | 0.1235 |
| Weighted residual factors for all reflections included in the refinement | 0.1491 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.194 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4074862.html
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Users of the data should acknowledge the original authors of the
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