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Information card for entry 4074864
Preview
| Coordinates | 4074864.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H39 N Ni P2 Si |
|---|---|
| Calculated formula | C40 H39 N Ni P2 Si |
| SMILES | [Ni]12([P](c3ccccc3)(c3ccccc3)c3ccccc3N2c2ccccc2[P]1(c1ccccc1)c1ccccc1)C[Si](C)(C)C |
| Title of publication | Amido Pincer Complexes of Nickel(II): Synthesis, Structure, and Reactivity |
| Authors of publication | Liang, Lan-Chang; Chien, Pin-Shu; Lin, Jia-Ming; Huang, Mei-Hui; Huang, Yu-Lun; Liao, Ju-Hsiou |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 6 |
| Pages of publication | 1399 - 1411 |
| a | 10.9794 ± 0.0002 Å |
| b | 15.7917 ± 0.0004 Å |
| c | 20.8066 ± 0.0004 Å |
| α | 96.604 ± 0.002° |
| β | 94.5042 ± 0.0014° |
| γ | 90.539 ± 0.0008° |
| Cell volume | 3571.9 ± 0.13 Å3 |
| Cell temperature | 298 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.15 |
| Residual factor for significantly intense reflections | 0.067 |
| Weighted residual factors for all reflections | 0.197 |
| Weighted residual factors for significantly intense reflections | 0.162 |
| Weighted residual factors for all reflections included in the refinement | 0.162 |
| Goodness-of-fit parameter for all reflections | 2.854 |
| Goodness-of-fit parameter for significantly intense reflections | 3.008 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.962 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.