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Information card for entry 4075224
Preview
| Coordinates | 4075224.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H35 B Cl2 N6 Pt |
|---|---|
| Calculated formula | C25 H35 B Cl2 N6 Pt |
| SMILES | [PtH]123(CC(C)c4ccccc14)[n]1n([BH](n4[n]2c(cc4C)C)n2[n]3c(cc2C)C)c(cc1C)C.C(Cl)Cl |
| Title of publication | Ethylene Insertion in Tp‘Pt(Ph)(η2-CH2CH2) and C−H Activation of Ethylbenzene to Form a Platinum(IV)ortho-Metalated Phenethyl Complex |
| Authors of publication | MacDonald, Margaret G.; Kostelansky, Cynthia Norris; White, Peter S.; Templeton, Joseph L. |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 19 |
| Pages of publication | 4560 |
| a | 28.0057 ± 0.0006 Å |
| b | 12.4619 ± 0.0003 Å |
| c | 15.514 ± 0.0003 Å |
| α | 90° |
| β | 94.351 ± 0.001° |
| γ | 90° |
| Cell volume | 5398.8 ± 0.2 Å3 |
| Cell temperature | 273 ± 2 K |
| Ambient diffraction temperature | 273 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.031 |
| Residual factor for significantly intense reflections | 0.0251 |
| Weighted residual factors for significantly intense reflections | 0.0518 |
| Weighted residual factors for all reflections included in the refinement | 0.0539 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4075224.html
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