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Information card for entry 4075555
Preview
| Coordinates | 4075555.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H36 F12 Fe2 P2 |
|---|---|
| Calculated formula | C31 H36 F12 Fe2 P2 |
| Title of publication | Bulk Synthesis of Octa- and Nonamethylfluorene (Flu‘ ‘H and Flu*H) and the Characterization of the Organometallic Derivatives Flu*SnMe3, [(FeCp)2Flu*H][PF6]2, and [(FeCp)2Flu‘ ‘H][PF6]2 |
| Authors of publication | Moss, James; Thomas, Jemima; Ashley, Andrew; Cowley, Andrew R.; O'Hare, Dermot |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 18 |
| Pages of publication | 4279 |
| a | 13.3125 ± 0.0003 Å |
| b | 17.3087 ± 0.0005 Å |
| c | 6.7634 ± 0.0002 Å |
| α | 90° |
| β | 98.294 ± 0.0012° |
| γ | 90° |
| Cell volume | 1542.14 ± 0.07 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Sample thermal history | The material was crystallised at ambient temperature. A suitable crystal was cooled rapidly to 150K for single-crystal X-ray diffraction analysis. |
| Number of distinct elements | 5 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0592 |
| Residual factor for significantly intense reflections | 0.0485 |
| Weighted residual factors for all reflections | 0.0648 |
| Weighted residual factors for significantly intense reflections | 0.0585 |
| Weighted residual factors for all reflections included in the refinement | 0.0585 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0821 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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