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Information card for entry 4075958
Preview
| Coordinates | 4075958.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H83 N P2 Ru Si2 |
|---|---|
| Calculated formula | C40 H83 N P2 Ru Si2 |
| SMILES | [RuH4]1([P](C4CCCCC4)(C4CCCCC4)C4CCCCC4)([P](C4CCCCC4)(C4CCCCC4)C4CCCCC4)[Si](N[Si]1(C)C)(C)C |
| Title of publication | Structure and Bonding in a Disilazane Ruthenium Complex. Catalytic Selective Deuteration of Disilazane |
| Authors of publication | Ayed, Tahra; Barthelat, Jean-Claude; Tangour, Bahoueddine; Pradère, Caroline; Donnadieu, Bruno; Grellier, Mary; Sabo-Etienne, Sylviane |
| Journal of publication | Organometallics |
| Year of publication | 2005 |
| Journal volume | 24 |
| Journal issue | 16 |
| Pages of publication | 3824 |
| a | 17.443 ± 0.003 Å |
| b | 20.752 ± 0.004 Å |
| c | 23.465 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 8494 ± 3 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 20 |
| Hermann-Mauguin space group symbol | C 2 2 21 |
| Hall space group symbol | C 2c 2 |
| Residual factor for all reflections | 0.0673 |
| Residual factor for significantly intense reflections | 0.0387 |
| Weighted residual factors for significantly intense reflections | 0.0575 |
| Weighted residual factors for all reflections included in the refinement | 0.0632 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.863 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4075958.html
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