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Information card for entry 4076008
Preview
| Coordinates | 4076008.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H22 O6 Re2 Si |
|---|---|
| Calculated formula | C30 H22 O6 Re2 Si |
| SMILES | [Re]1([H][Re]23456(C#[O])(C#[O])[c]7([Si]1(c1ccccc1)c1ccccc1)[cH]3[cH]4[cH]5[cH]6[cH]27)(C#[O])(C#[O])(C#[O])C#[O].c1ccccc1 |
| Title of publication | Rhenium Carbonyl Complexes Containing Bridging SiPh3and SiPh2Ligands |
| Authors of publication | Adams, Richard D.; Smith, Jack L. |
| Journal of publication | Organometallics |
| Year of publication | 2005 |
| Journal volume | 24 |
| Journal issue | 18 |
| Pages of publication | 4489 |
| a | 9.7639 ± 0.0004 Å |
| b | 16.9418 ± 0.0007 Å |
| c | 17.9854 ± 0.0008 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2975.1 ± 0.2 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0186 |
| Residual factor for significantly intense reflections | 0.0179 |
| Weighted residual factors for significantly intense reflections | 0.0445 |
| Weighted residual factors for all reflections included in the refinement | 0.0448 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4076008.html
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Users of the data should acknowledge the original authors of the
structural data.