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Information card for entry 4076070
Preview
| Coordinates | 4076070.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H18 Cl3 N2 Nb Si |
|---|---|
| Calculated formula | C10 H18 Cl3 N2 Nb Si |
| SMILES | [Nb]123456(N(CCC[NH2]1)[Si]([c]13[cH]4[cH]5[cH]6[cH]21)(C)C)(Cl)(Cl)Cl |
| Title of publication | Cyclopentadienyl-Silyl-Amido Niobium Complexes Prepared by a Transmetalation Reaction Using Ti{η5-C5H4SiMe2-η-N(CH2)2NRR‘}Cl2† |
| Authors of publication | Maestre, M. Carmen; Tabernero, Vanessa; Mosquera, Marta E. G.; Jiménez, Gerardo; Cuenca, Tomás |
| Journal of publication | Organometallics |
| Year of publication | 2005 |
| Journal volume | 24 |
| Journal issue | 24 |
| Pages of publication | 5853 |
| a | 14.3848 ± 0.0015 Å |
| b | 7.5381 ± 0.0007 Å |
| c | 15.2675 ± 0.0013 Å |
| α | 90° |
| β | 110.582 ± 0.01° |
| γ | 90° |
| Cell volume | 1549.8 ± 0.3 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0568 |
| Residual factor for significantly intense reflections | 0.0326 |
| Weighted residual factors for significantly intense reflections | 0.0633 |
| Weighted residual factors for all reflections included in the refinement | 0.0687 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.006 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.