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Information card for entry 4076229
Preview
| Coordinates | 4076229.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H40 Cl2 N Ta |
|---|---|
| Calculated formula | C34.001 H40 Cl2 N Ta |
| Title of publication | Synthesis and Reactivity of Alkyl, Hydride, and Silyl Derivatives of the (Terphenyl)imido Fragments Cp*(ArMesN)Ta (Cp* = η5-C5Me5; ArMes= 2,6-(2,4,6-Me3C6H2)2C6H3) and Cp*(ArTripN)Ta (ArTrip= 2,6-(2,4,6-iPr3C6H2)2C6H3) |
| Authors of publication | Gavenonis, John; Tilley, T. Don |
| Journal of publication | Organometallics |
| Year of publication | 2004 |
| Journal volume | 23 |
| Journal issue | 1 |
| Pages of publication | 31 |
| a | 13.8709 ± 0.0002 Å |
| b | 12.2732 ± 0.0001 Å |
| c | 18.7458 ± 0.0003 Å |
| α | 90 ± 0.001° |
| β | 99.857 ± 0.001° |
| γ | 90 ± 0.001° |
| Cell volume | 3144.18 ± 0.07 Å3 |
| Cell temperature | 172.2 K |
| Ambient diffraction temperature | 172.2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0395 |
| Residual factor for significantly intense reflections | 0.0239 |
| Weighted residual factors for all reflections | 0.0342 |
| Weighted residual factors for significantly intense reflections | 0.0313 |
| Weighted residual factors for all reflections included in the refinement | 0.0313 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.214 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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