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Information card for entry 4076740
Preview
| Coordinates | 4076740.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | [Et4N][Ru(Sxylyl)4Cl] ? |
|---|---|
| Formula | C41 H58 Cl3 N Ru S4 |
| Calculated formula | C41 H58 Cl3 N Ru S4 |
| SMILES | c1(c(cccc1C)C)S[Ru](Cl)(Sc1c(cccc1C)C)(Sc1c(cccc1C)C)Sc1c(cccc1C)C.C(C)[N+](CC)(CC)CC.C(Cl)Cl |
| Title of publication | σ-Acetylide Complexes of Ruthenium(IV) and Osmium(IV) Thiolates |
| Authors of publication | Zhang, Qian-Feng; Lai, Chui-Ying; Wong, Wai-Yeung; Leung, Wa-Hung |
| Journal of publication | Organometallics |
| Year of publication | 2002 |
| Journal volume | 21 |
| Journal issue | 19 |
| Pages of publication | 4017 |
| a | 13.4154 ± 0.0008 Å |
| b | 15.7625 ± 0.0009 Å |
| c | 21.1569 ± 0.0012 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4473.8 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0817 |
| Residual factor for significantly intense reflections | 0.0385 |
| Weighted residual factors for significantly intense reflections | 0.0853 |
| Weighted residual factors for all reflections included in the refinement | 0.103 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.762 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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