Information card for entry 4076760

Structure parameters

• Common name: [SnMe2{(Me3Si)2CSiMe2CH2CH2SiMe2C(SiMe3)(SiMe2OSO2CF3}]
• Formula: C22 H55 F3 O3 S Si6 Sn
• Calculated formula: C22 H55 F3 O3 S Si6 Sn
• SMILES: [Sn]1(C([Si](OS(=O)(=O)C(F)(F)F)(C)C)([Si](C)(C)C)[Si](C)(C)CC[Si](C1([Si](C)(C)C)[Si](C)(C)C)(C)C)(C)C
• Title of publication: Reactions of a Highly Crowded Triorganotin Iodide with Silver Salts. Migration of a Methyl Group from Silicon to Tin within a Cation
• Authors of publication: Asadi, Ashrafolmolouk; Avent, Anthony G.; Eaborn, Colin; Hill, Michael S.; Hitchcock, Peter B.; Meehan, Margaret M.; Smith, J. David
• Journal of publication: Organometallics
• Year of publication: 2002
• Journal volume: 21
• Journal issue: 11
• Pages of publication: 2183
• a: 13.0809 ± 0.001 Å
• b: 16.378 ± 0.0007 Å
• c: 17.1546 ± 0.0013 Å
• α: 90°
• β: 107.052 ± 0.003°
• γ: 90°
• Cell volume: 3513.6 ± 0.4 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0811
• Residual factor for significantly intense reflections: 0.0531
• Weighted residual factors for significantly intense reflections: 0.1208
• Weighted residual factors for all reflections included in the refinement: 0.1331
• Goodness-of-fit parameter for all reflections included in the refinement: 1.033
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No