Information card for entry 4076888

Structure parameters

• Formula: C32 H88 Cr4 Si8
• Calculated formula: C32 H88 Cr4 Si8
• SMILES: [Cr]1([Cr]([Cr]([Cr]1(C[Si](C)(C)C)C[Si](C)(C)C)(C[Si](C)(C)C)C[Si](C)(C)C)(C[Si](C)(C)C)C[Si](C)(C)C)(C[Si](C)(C)C)C[Si](C)(C)C
• Title of publication: The Unusual Stability of Homoleptic Di- and Tetravalent Chromium Alkyls
• Authors of publication: Schulzke, Carola; Enright, Dave; Sugiyama, Hiroyasu; LeBlanc, Guy; Gambarotta, Sandro; Yap, Glenn P. A.; Thompson, Laurence K.; Wilson, David R.; Duchateau, Rob
• Journal of publication: Organometallics
• Year of publication: 2002
• Journal volume: 21
• Journal issue: 18
• Pages of publication: 3810
• a: 17.0805 ± 0.0016 Å
• b: 13.4843 ± 0.0013 Å
• c: 22.873 ± 0.002 Å
• α: 90°
• β: 99.603 ± 0.002°
• γ: 90°
• Cell volume: 5194.3 ± 0.8 ų
• Cell temperature: 203 ± 2 K
• Ambient diffraction temperature: 203 ± 2 K
• Number of distinct elements: 4
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.1292
• Residual factor for significantly intense reflections: 0.0541
• Weighted residual factors for significantly intense reflections: 0.1153
• Weighted residual factors for all reflections included in the refinement: 0.1429
• Goodness-of-fit parameter for all reflections included in the refinement: 1.024
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No