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Information card for entry 4076890
Preview
| Coordinates | 4076890.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C45 H32 Cl O P2 Rh |
|---|---|
| Calculated formula | C45 H32 Cl O P2 Rh |
| SMILES | [Rh]1([P](c2ccc3ccccc3c2c2c([P]1(c1ccccc1)c1ccccc1)ccc1ccccc21)(c1ccccc1)c1ccccc1)(Cl)C#[O] |
| Title of publication | Stoichiometric and Catalytic Oxidation of BINAP by Dioxygen in a Rhodium(I) Complex |
| Authors of publication | Bunten, Kevin A.; Farrar, David H.; Poë, Anthony J.; Lough, Alan |
| Journal of publication | Organometallics |
| Year of publication | 2002 |
| Journal volume | 21 |
| Journal issue | 16 |
| Pages of publication | 3344 |
| a | 11.771 ± 0.0003 Å |
| b | 11.567 ± 0.0003 Å |
| c | 13.848 ± 0.0004 Å |
| α | 90° |
| β | 110.17 ± 0.0014° |
| γ | 90° |
| Cell volume | 1769.85 ± 0.08 Å3 |
| Cell temperature | 100 ± 1 K |
| Ambient diffraction temperature | 100 ± 1 K |
| Number of distinct elements | 6 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0377 |
| Residual factor for significantly intense reflections | 0.0294 |
| Weighted residual factors for significantly intense reflections | 0.0604 |
| Weighted residual factors for all reflections included in the refinement | 0.0622 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
| Diffraction radiation wavelength | 0.7122 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4076890.html
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