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Information card for entry 4077122
Preview
| Coordinates | 4077122.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C79 H72.5 O2.38 P3 Ru Si2 |
|---|---|
| Calculated formula | C79 H72.5 O2.375 P3 Ru Si2 |
| Title of publication | Exchange Processes in Complexes with Two Ruthenium (η2-Silane) Linkages: Role of the Secondary Interactions between Silicon and Hydrogen Atoms |
| Authors of publication | Atheaux, Isabelle; Delpech, Fabien; Donnadieu, Bruno; Sabo-Etienne, Sylviane; Chaudret, Bruno; Hussein, Khansaa; Barthelat, Jean-Claude; Braun, Thomas; Duckett, Simon B.; Perutz, Robin N. |
| Journal of publication | Organometallics |
| Year of publication | 2002 |
| Journal volume | 21 |
| Journal issue | 24 |
| Pages of publication | 5347 |
| a | 40.246 ± 0.003 Å |
| b | 19.777 ± 0.003 Å |
| c | 17.734 ± 0.004 Å |
| α | 89.99 ± 0.02° |
| β | 91.03 ± 0.02° |
| γ | 90.02 ± 0.02° |
| Cell volume | 14113 ± 4 Å3 |
| Cell temperature | 160 ± 2 K |
| Ambient diffraction temperature | 140 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0782 |
| Residual factor for significantly intense reflections | 0.0485 |
| Weighted residual factors for significantly intense reflections | 0.1119 |
| Weighted residual factors for all reflections included in the refinement | 0.1244 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.996 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4077122.html
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