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Information card for entry 4077655
Preview
| Coordinates | 4077655.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Diethylaluminium-bis(trimethylsilyl)bismutan-Dimethylaminopyridin-adduct |
|---|---|
| Formula | C17 H38 Al Bi N2 Si2 |
| Calculated formula | C17 H38 Al Bi N2 Si2 |
| SMILES | [Bi]([Si](C)(C)C)([Si](C)(C)C)[Al](CC)(CC)[n]1ccc(cc1)N(C)C |
| Title of publication | Synthesis and X-ray Crystal Structures of Novel Al−Bi and Ga−Bi Compounds† |
| Authors of publication | Kuczkowski, Andreas; Thomas, Florian; Schulz, Stephan; Nieger, Martin |
| Journal of publication | Organometallics |
| Year of publication | 2000 |
| Journal volume | 19 |
| Journal issue | 26 |
| Pages of publication | 5758 |
| a | 9.6324 ± 0.0004 Å |
| b | 10.3942 ± 0.0004 Å |
| c | 14.144 ± 0.0004 Å |
| α | 77.476 ± 0.002° |
| β | 76.342 ± 0.002° |
| γ | 69.756 ± 0.002° |
| Cell volume | 1276.8 ± 0.08 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0439 |
| Residual factor for significantly intense reflections | 0.0404 |
| Weighted residual factors for significantly intense reflections | 0.1064 |
| Weighted residual factors for all reflections included in the refinement | 0.1079 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.101 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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