Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4078349
Preview
| Coordinates | 4078349.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H76 F Li N2 Si |
|---|---|
| Calculated formula | C48 H76 F Li N2 Si |
| SMILES | [Si]1(/C(=C(C(C)(C)C)/c2ccccc2)[Li]2([F]1)[N](CC[N]2(C)C)(C)C)(c1c(cc(cc1C(C)C)C(C)C)C(C)C)c1c(cc(cc1C(C)C)C(C)C)C(C)C |
| Title of publication | Synthesis and Reactivity of Several Stable 1-Silaallenes |
| Authors of publication | Trommer, Martin; Miracle, Gary E.; Eichler, Barrett E.; Powell, Douglas R.; West, Robert |
| Journal of publication | Organometallics |
| Year of publication | 1997 |
| Journal volume | 16 |
| Journal issue | 26 |
| Pages of publication | 5737 |
| a | 11.1037 ± 0.0002 Å |
| b | 11.8678 ± 0.0002 Å |
| c | 19.2126 ± 0.0003 Å |
| α | 87.28 ± 0.002° |
| β | 86.519 ± 0.002° |
| γ | 69.337 ± 0.002° |
| Cell volume | 2363.62 ± 0.08 Å3 |
| Cell temperature | 133 ± 2 K |
| Ambient diffraction temperature | 133 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0514 |
| Residual factor for significantly intense reflections | 0.0381 |
| Weighted residual factors for all reflections | 0.1029 |
| Weighted residual factors for significantly intense reflections | 0.0956 |
| Goodness-of-fit parameter for all reflections | 1.02 |
| Goodness-of-fit parameter for significantly intense reflections | 1.058 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4078349.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.