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Information card for entry 4078356
Preview
| Coordinates | 4078356.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H52 I P2 Rh |
|---|---|
| Calculated formula | C34 H52 I P2 Rh |
| SMILES | [Rh]1([P](C(C)C)(C(C)C)C(C)C)([P](C(C)C)(C(C)C)C(C)C)(I)[CH](=[CH]1C#Cc1ccccc1)c1ccccc1 |
| Title of publication | Five- and Six-Coordinate Bis(alkynyl)rhodium(III) Complexes Containing a Rh−SnPh3Bond |
| Authors of publication | Werner, Helmut; Gevert, Olaf; Haquette, Pierre |
| Journal of publication | Organometallics |
| Year of publication | 1997 |
| Journal volume | 16 |
| Journal issue | 4 |
| Pages of publication | 803 |
| a | 12.719 ± 0.009 Å |
| b | 12.474 ± 0.004 Å |
| c | 24.5 ± 0.04 Å |
| α | 90° |
| β | 93.05 ± 0.04° |
| γ | 90° |
| Cell volume | 3882 ± 7 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0428 |
| Residual factor for significantly intense reflections | 0.0293 |
| Weighted residual factors for all reflections | 0.071 |
| Weighted residual factors for significantly intense reflections | 0.0631 |
| Goodness-of-fit parameter for all reflections | 1.057 |
| Goodness-of-fit parameter for significantly intense reflections | 1.06 |
| Diffraction radiation wavelength | 0.7093 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4078356.html
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Users of the data should acknowledge the original authors of the
structural data.