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Information card for entry 4078387
Preview
| Coordinates | 4078387.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H27 N O2 Si2 W |
|---|---|
| Calculated formula | C15 H27 N O2 Si2 W |
| SMILES | [W]12345([Si]([N+](CC)(CC)[Si]1(C)C)(C)C)(C#[O])(C#[O])[cH]1[cH]2[cH]4[cH]5[cH]31 |
| Title of publication | Synthesis, Structure, and Fluxional Behavior of Donor-Stabilized Bis(silylene)tungsten Complexes |
| Authors of publication | Ueno, Keiji; Masuko, Akira; Ogino, Hiroshi |
| Journal of publication | Organometallics |
| Year of publication | 1997 |
| Journal volume | 16 |
| Journal issue | 23 |
| Pages of publication | 5023 |
| a | 16.569 ± 0.0014 Å |
| b | 8.7952 ± 0.0009 Å |
| c | 12.953 ± 0.002 Å |
| α | 90° |
| β | 94.43 ± 0.012° |
| γ | 90° |
| Cell volume | 1882 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/a 1 |
| Hall space group symbol | -P 2yab |
| Residual factor for all reflections | 0.0765 |
| Residual factor for significantly intense reflections | 0.0526 |
| Weighted residual factors for all reflections | 0.1246 |
| Weighted residual factors for significantly intense reflections | 0.1176 |
| Goodness-of-fit parameter for all reflections | 0.998 |
| Goodness-of-fit parameter for significantly intense reflections | 1.082 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4078387.html
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Users of the data should acknowledge the original authors of the
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