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Information card for entry 4078779
Preview
| Coordinates | 4078779.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | [2-(Ethoxymethylidenyl)-4-methyl-4-<i>H</i>-thienopyrrole](pentacarbonyl) tungsten |
|---|---|
| Formula | C15 H11 N O6 S W |
| Calculated formula | C15 H11 N O6 S W |
| SMILES | [W](C#[O])(C#[O])(C#[O])(C#[O])(C#[O])=C(OCC)c1sc2c(n(cc2)C)c1 |
| Title of publication | Fischer Dinuclear and Mononuclear Bis-Carbene Complexes of Thiophene and Thiophene Derivatives |
| Authors of publication | Lotz, Simon; van Jaarsveld, Nina A.; Liles, David C.; Crause, Chantelle; Görls, Helmar; Terblans, Yvette M. |
| Journal of publication | Organometallics |
| Year of publication | 2012 |
| Journal volume | 31 |
| Journal issue | 15 |
| Pages of publication | 5371 |
| a | 7.1651 ± 0.0004 Å |
| b | 11.4198 ± 0.0007 Å |
| c | 11.8024 ± 0.0007 Å |
| α | 65.739 ± 0.003° |
| β | 82.524 ± 0.003° |
| γ | 73.027 ± 0.003° |
| Cell volume | 842.02 ± 0.09 Å3 |
| Cell temperature | 183 ± 2 K |
| Ambient diffraction temperature | 183 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.04 |
| Residual factor for significantly intense reflections | 0.0315 |
| Weighted residual factors for significantly intense reflections | 0.0617 |
| Weighted residual factors for all reflections included in the refinement | 0.0627 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.944 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.