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Information card for entry 4078781
Preview
| Coordinates | 4078781.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | [2,3-Di(ethoxymethylidenyl)-4-methyl-4-<i>H</i>-thienopyrrole](tetracarbonyl) tungsten |
|---|---|
| Formula | C17 H15 N O6 S W |
| Calculated formula | C17 H15 N O6 S W |
| SMILES | [W]1(C#[O])(C#[O])(C#[O])(C#[O])=C(OCC)c2c(C=1OCC)sc1c2n(cc1)C |
| Title of publication | Fischer Dinuclear and Mononuclear Bis-Carbene Complexes of Thiophene and Thiophene Derivatives |
| Authors of publication | Lotz, Simon; van Jaarsveld, Nina A.; Liles, David C.; Crause, Chantelle; Görls, Helmar; Terblans, Yvette M. |
| Journal of publication | Organometallics |
| Year of publication | 2012 |
| Journal volume | 31 |
| Journal issue | 15 |
| Pages of publication | 5371 |
| a | 10.7349 ± 0.0003 Å |
| b | 7.2361 ± 0.0002 Å |
| c | 23.4138 ± 0.0005 Å |
| α | 90° |
| β | 94.075 ± 0.002° |
| γ | 90° |
| Cell volume | 1814.16 ± 0.08 Å3 |
| Cell temperature | 183 ± 2 K |
| Ambient diffraction temperature | 183 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0408 |
| Residual factor for significantly intense reflections | 0.0324 |
| Weighted residual factors for significantly intense reflections | 0.0792 |
| Weighted residual factors for all reflections included in the refinement | 0.0807 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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