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Information card for entry 4079179
Preview
| Coordinates | 4079179.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C70 H54 N4 Si2 |
|---|---|
| Calculated formula | C70 H54 N4 Si2 |
| SMILES | c1c(/C(=C\c2ccc(cc2)C#N)[Si](c2ccccc2)(c2ccccc2)[Si](/C(=C/c2ccc(cc2)C#N)c2ccc(cc2)C#N)(c2ccccc2)c2ccccc2)ccc(c1)C#N.Cc1ccccc1.Cc1ccccc1 |
| Title of publication | Preparation and Properties of Perarylated 3,4-Disila-1,5-hexadienes. A Fluorescent Disilane Accommodated in the Crystal Lattice |
| Authors of publication | Tanabe, Makoto; Yumoto, Ryouhei; Osakada, Kohtaro; Sanji, Takanobu; Tanaka, Masato |
| Journal of publication | Organometallics |
| Year of publication | 2012 |
| Journal volume | 31 |
| Journal issue | 19 |
| Pages of publication | 6787 |
| a | 9.504 ± 0.004 Å |
| b | 12.433 ± 0.005 Å |
| c | 12.806 ± 0.005 Å |
| α | 103.954 ± 0.005° |
| β | 94.733 ± 0.004° |
| γ | 105.892 ± 0.005° |
| Cell volume | 1394.4 ± 1 Å3 |
| Cell temperature | 113 K |
| Ambient diffraction temperature | 113 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.101 |
| Residual factor for significantly intense reflections | 0.08 |
| Weighted residual factors for significantly intense reflections | 0.2163 |
| Weighted residual factors for all reflections included in the refinement | 0.2392 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.343 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4079179.html
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Users of the data should acknowledge the original authors of the
structural data.