Information card for entry 4079729

Structure parameters

• Formula: C52 H92 Rh2 Si4
• Calculated formula: C52 H92 Rh2 Si4
• SMILES: [c]1234[c]567[cH]8[cH]9[c]1([Rh]1%10%11%122589[c]25[cH]8[cH]9[c]%13([c]5([cH]%11[cH]%10[c]12[Si](C(C)C)(C(C)C)C(C)C)[Rh]1247%1289%13[c]6([cH]1[cH]32)[Si](C(C)C)(C(C)C)C(C)C)[Si](C(C)C)(C(C)C)C(C)C)[Si](C(C)C)(C(C)C)C(C)C
• Title of publication: Double-Sandwich Pentalene Complexes M2(pent†)2(M = Rh, Pd; pent†= 1,4-Bis(triisopropylsilyl)pentalene): Synthesis, Structure, and Bonding
• Authors of publication: Summerscales, Owen T.; Rivers, Christopher J.; Taylor, Morgan J.; Hitchcock, Peter B.; Green, Jennifer C.; Cloke, F. Geoffrey N.
• Journal of publication: Organometallics
• Year of publication: 2012
• Journal volume: 31
• Journal issue: 24
• Pages of publication: 8613
• a: 22.188 ± 0.005 Å
• b: 13.183 ± 0.003 Å
• c: 21.397 ± 0.011 Å
• α: 90°
• β: 120.37 ± 0.03°
• γ: 90°
• Cell volume: 5400 ± 4 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 4
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0789
• Residual factor for significantly intense reflections: 0.0638
• Weighted residual factors for significantly intense reflections: 0.1648
• Weighted residual factors for all reflections included in the refinement: 0.1776
• Goodness-of-fit parameter for all reflections included in the refinement: 1.06
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No