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Information card for entry 4079845
Preview
| Coordinates | 4079845.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H50 Cl6 N4 O6 Se2 Sn2 |
|---|---|
| Calculated formula | C38 H50 Cl6 N4 O6 Se2 Sn2 |
| SMILES | CN(Cc1c([Sn]2(O[Se](=O)O[Sn](c3c(cccc3CN(C)C)CN(C)C)(O[Se](O2)=O)c2ccccc2)c2ccccc2)c(ccc1)CN(C)C)C.C(Cl)(Cl)Cl.C(Cl)(Cl)Cl |
| Title of publication | Intramolecularly Coordinated Group 14 and 15 Chalcogenites |
| Authors of publication | Mairychová, Barbora; Svoboda, Tomáš; Erben, Milan; Růžička, Aleš; Dostál, Libor; Jambor, Roman |
| Journal of publication | Organometallics |
| Year of publication | 2013 |
| Journal volume | 32 |
| Journal issue | 1 |
| Pages of publication | 157 |
| a | 26.3225 ± 0.0007 Å |
| b | 9.491 ± 0.0003 Å |
| c | 20.1493 ± 0.0006 Å |
| α | 90° |
| β | 106.131 ± 0.005° |
| γ | 90° |
| Cell volume | 4835.6 ± 0.3 Å3 |
| Cell temperature | 150 ± 1 K |
| Ambient diffraction temperature | 150 ± 1 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0639 |
| Residual factor for significantly intense reflections | 0.0381 |
| Weighted residual factors for significantly intense reflections | 0.0727 |
| Weighted residual factors for all reflections included in the refinement | 0.0819 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.08 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4079845.html
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Users of the data should acknowledge the original authors of the
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