Information card for entry 4080612
| Formula |
C24 H30 Ge2 |
| Calculated formula |
C24 H30 Ge2 |
| SMILES |
[Ge]([Ge](C(C)(C)C)(C)C)(c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication |
Substituent Effects in Digermanes: Electrochemical, Theoretical, and Structural Investigations |
| Authors of publication |
Schrick, Erin K.; Forget, Trevor J.; Roewe, Kimberly D.; Schrick, Aaron C.; Moore, Curtis E.; Golen, James A.; Rheingold, Arnold L.; Materer, Nicholas F.; Weinert, Charles S. |
| Journal of publication |
Organometallics |
| Year of publication |
2013 |
| Journal volume |
32 |
| Journal issue |
7 |
| Pages of publication |
2245 |
| a |
8.2473 ± 0.0008 Å |
| b |
9.8391 ± 0.001 Å |
| c |
15.0469 ± 0.0013 Å |
| α |
87.343 ± 0.005° |
| β |
85.481 ± 0.005° |
| γ |
65.243 ± 0.005° |
| Cell volume |
1105.21 ± 0.19 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0293 |
| Residual factor for significantly intense reflections |
0.0222 |
| Weighted residual factors for significantly intense reflections |
0.0518 |
| Weighted residual factors for all reflections included in the refinement |
0.0544 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.039 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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