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Information card for entry 4080762
Preview
| Coordinates | 4080762.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Phtalimide-[1,2-bis(diisopropylphosphanyl)ethane-P,P]-chloro-nickel(II) |
|---|---|
| Formula | C22 H36 Cl N Ni O2 P2 |
| Calculated formula | C22 H36 Cl N Ni O2 P2 |
| Title of publication | Selective C═O Reduction in Phthalimide with Nickel(0) Compounds |
| Authors of publication | Arévalo, Alma; Ovando-Segovia, Sebastián; Flores-Alamo, Marcos; Garc\?ía, Juventino J. |
| Journal of publication | Organometallics |
| Year of publication | 2013 |
| Journal volume | 32 |
| Journal issue | 10 |
| Pages of publication | 2939 |
| a | 31.6164 ± 0.001 Å |
| b | 13.6477 ± 0.0005 Å |
| c | 16.4738 ± 0.0006 Å |
| α | 90° |
| β | 92.856 ± 0.003° |
| γ | 90° |
| Cell volume | 7099.5 ± 0.4 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0749 |
| Residual factor for significantly intense reflections | 0.0535 |
| Weighted residual factors for significantly intense reflections | 0.1605 |
| Weighted residual factors for all reflections included in the refinement | 0.1755 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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