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Information card for entry 4081183
Preview
| Coordinates | 4081183.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H52 Li N5 Si2 |
|---|---|
| Calculated formula | C22 H52 Li N5 Si2 |
| SMILES | [Si](N(C)C)(/C=C/C(/C=C/[Si](N(C)C)(C)C)[Li]12[N](CC[N]1(CC[N]2(C)C)C)(C)C)(C)C |
| Title of publication | Structural Influences in Lithium Pentadienylsilane Complexes |
| Authors of publication | Day, Benjamin M.; Clayden, Jonathan; Layfield, Richard A. |
| Journal of publication | Organometallics |
| Year of publication | 2013 |
| Journal volume | 32 |
| Journal issue | 15 |
| Pages of publication | 4448 |
| a | 8.0142 ± 0.0003 Å |
| b | 12.4095 ± 0.0004 Å |
| c | 15.2613 ± 0.0004 Å |
| α | 100.332 ± 0.003° |
| β | 101.726 ± 0.002° |
| γ | 94.214 ± 0.003° |
| Cell volume | 1452.45 ± 0.08 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0631 |
| Residual factor for significantly intense reflections | 0.0528 |
| Weighted residual factors for significantly intense reflections | 0.1428 |
| Weighted residual factors for all reflections included in the refinement | 0.1512 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 1.5418 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4081183.html
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Users of the data should acknowledge the original authors of the
structural data.