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Information card for entry 4081575
Preview
| Coordinates | 4081575.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H14 Br Fe N O2 |
|---|---|
| Calculated formula | C20 H14 Br Fe N O2 |
| SMILES | Br/C(=C\[c]12[Fe]3456789([cH]1[cH]3[cH]4[cH]25)[cH]1[cH]6[cH]7[cH]8[cH]91)C#Cc1ccc(N(=O)=O)cc1 |
| Title of publication | Syntheses, Spectroelectrochemical Studies, and Molecular and Electronic Structures of Ferrocenyl Ene-diynes |
| Authors of publication | Vincent, Kevin B.; Zeng, Qiang; Parthey, Matthias; Yufit, Dmitry S.; Howard, Judith A.K.; Hartl, František; Kaupp, Martin; Low, Paul J. |
| Journal of publication | Organometallics |
| Year of publication | 2013 |
| Journal volume | 32 |
| Journal issue | 20 |
| Pages of publication | 6022 |
| a | 25.4582 ± 0.0013 Å |
| b | 11.3257 ± 0.0003 Å |
| c | 12.0048 ± 0.0005 Å |
| α | 90° |
| β | 100.582 ± 0.004° |
| γ | 90° |
| Cell volume | 3402.5 ± 0.2 Å3 |
| Cell temperature | 120 K |
| Ambient diffraction temperature | 120 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0684 |
| Residual factor for significantly intense reflections | 0.0454 |
| Weighted residual factors for significantly intense reflections | 0.0979 |
| Weighted residual factors for all reflections included in the refinement | 0.1076 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.077 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4081575.html
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Users of the data should acknowledge the original authors of the
structural data.