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Information card for entry 4081885
Preview
| Coordinates | 4081885.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Integration of K102Duo |
|---|---|
| Formula | C70 H92 N P Sn |
| Calculated formula | C70 H92 N P Sn |
| SMILES | [Sn]1(c2c(P(c3ccccc3)(=[N]1C13CC4CC(CC(C1)C4)C3)c1ccccc1)cccc2)c1c(c2c(C(C)C)cc(C(C)C)cc2C(C)C)cccc1c1c(cc(cc1C(C)C)C(C)C)C(C)C.CCCCCC |
| Title of publication | Stannylene-Based Lewis Pairs |
| Authors of publication | Freitag, Sarah; Krebs, Kilian M.; Henning, Jens; Hirdler, Janina; Schubert, Hartmut; Wesemann, Lars |
| Journal of publication | Organometallics |
| Year of publication | 2013 |
| Journal volume | 32 |
| Journal issue | 22 |
| Pages of publication | 6785 |
| a | 28.7237 ± 0.0014 Å |
| b | 23.8226 ± 0.0011 Å |
| c | 17.6686 ± 0.0009 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 12090.1 ± 1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0833 |
| Residual factor for significantly intense reflections | 0.0504 |
| Weighted residual factors for significantly intense reflections | 0.1013 |
| Weighted residual factors for all reflections included in the refinement | 0.1158 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.988 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4081885.html
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