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Information card for entry 4082333
Preview
| Coordinates | 4082333.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C27 H36 F3 Ga N2 |
|---|---|
| Calculated formula | C27 H36 F3 Ga N2 |
| SMILES | C(C)(C)c1c(c(C(C)C)ccc1)N1C(N(C=C1)c1c(C(C)C)cccc1C(C)C)=[Ga](F)(F)F |
| Title of publication | Structure, Stability, and Catalytic Activity of Fluorine-Bridged Complexes IPr·GaCl2(μ-F)EFn‒1(EFn‒= SbF6‒, PF6‒, or BF4‒) |
| Authors of publication | Bour, Christophe; Monot, Julien; Tang, Shun; Guillot, Régis; Farjon, Jonathan; Gandon, Vincent |
| Journal of publication | Organometallics |
| Year of publication | 2014 |
| Journal volume | 33 |
| Journal issue | 2 |
| Pages of publication | 594 |
| a | 10.2109 ± 0.0003 Å |
| b | 18.4364 ± 0.0004 Å |
| c | 14.6671 ± 0.0004 Å |
| α | 90° |
| β | 104.16 ± 0.001° |
| γ | 90° |
| Cell volume | 2677.22 ± 0.12 Å3 |
| Cell temperature | 100 ± 1 K |
| Ambient diffraction temperature | 100 ± 1 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0626 |
| Residual factor for significantly intense reflections | 0.0401 |
| Weighted residual factors for significantly intense reflections | 0.1012 |
| Weighted residual factors for all reflections included in the refinement | 0.1119 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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