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Information card for entry 4083779
Preview
| Coordinates | 4083779.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H33 F3 N4 O8 S Si W |
|---|---|
| Calculated formula | C28 H33 F3 N4 O8 S Si W |
| SMILES | [Si]1([W](C#[O])(C#[O])(C#[O])(C#[O])C#[O])([N](C(C)(C)C)=C(c2ccccc2)N1C(C)(C)C)[n]1ccc(cc1)N(C)C.C(F)(F)(F)S(=O)(=O)[O-] |
| Title of publication | A Base-Stabilized Silyliumylidene Cation as a Ligand for Rhodium and Tungsten Complexes |
| Authors of publication | Yeong, Hui-Xian; Li, Yongxin; So, Cheuk-Wai |
| Journal of publication | Organometallics |
| Year of publication | 2014 |
| Pages of publication | 140627113050000 |
| a | 12.6859 ± 0.0007 Å |
| b | 20.4319 ± 0.0012 Å |
| c | 13.4535 ± 0.0007 Å |
| α | 90° |
| β | 94.956 ± 0.002° |
| γ | 90° |
| Cell volume | 3474.1 ± 0.3 Å3 |
| Cell temperature | 103 ± 2 K |
| Ambient diffraction temperature | 103 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0629 |
| Residual factor for significantly intense reflections | 0.0367 |
| Weighted residual factors for significantly intense reflections | 0.0836 |
| Weighted residual factors for all reflections included in the refinement | 0.1168 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.096 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4083779.html
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Users of the data should acknowledge the original authors of the
structural data.