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Information card for entry 4083792
Preview
| Coordinates | 4083792.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H44 Fe P2 Se2 |
|---|---|
| Calculated formula | C26 H44 Fe P2 Se2 |
| SMILES | [Fe]12345678([c]9([cH]4[cH]3[cH]2[cH]19)P(=[Se])(C(C)(C)C)C(C)(C)C)[c]1([cH]5[cH]6[cH]7[cH]81)P(=[Se])(C(C)(C)C)C(C)(C)C |
| Title of publication | Anodic Electrochemistry of Free and Coordinated 1,1‘-Bis(di-tert-butylphosphino)ferrocene |
| Authors of publication | Blanco, Fawn N.; Hagopian, Laura E.; McNamara, William R.; Golen, James A.; Rheingold, Arnold L.; Nataro, Chip |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 18 |
| Pages of publication | 4292 |
| a | 14.9114 ± 0.0011 Å |
| b | 14.087 ± 0.0011 Å |
| c | 14.9432 ± 0.0011 Å |
| α | 90° |
| β | 117.789 ± 0.001° |
| γ | 90° |
| Cell volume | 2776.9 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0293 |
| Residual factor for significantly intense reflections | 0.0247 |
| Weighted residual factors for significantly intense reflections | 0.0612 |
| Weighted residual factors for all reflections included in the refinement | 0.0633 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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