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Information card for entry 4083826
Preview
| Coordinates | 4083826.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H33 Cl2 Cr I3 N O4 P2 |
|---|---|
| Calculated formula | C30 H33 Cl2 Cr I3 N O4 P2 |
| SMILES | [Cr]12(I)(I)(I)[P](N([P]1(c1ccccc1OC)c1ccccc1OC)C)(c1ccccc1[O]2C)c1ccccc1OC.C(Cl)Cl |
| Title of publication | A Chromium-Diphosphine System for Catalytic Ethylene Trimerization: Synthetic and Structural Studies of Chromium Complexes with a Nitrogen-Bridged Diphosphine Ligand withortho-Methoxyaryl Substituents |
| Authors of publication | Agapie, Theodor; Day, Michael W.; Henling, Lawrence M.; Labinger, Jay A.; Bercaw, John E. |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 11 |
| Pages of publication | 2733 |
| a | 13.5277 ± 0.0003 Å |
| b | 13.5151 ± 0.0003 Å |
| c | 20.3801 ± 0.0005 Å |
| α | 90° |
| β | 107.892 ± 0.001° |
| γ | 90° |
| Cell volume | 3545.86 ± 0.14 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0533 |
| Residual factor for significantly intense reflections | 0.0335 |
| Weighted residual factors for significantly intense reflections | 0.0499 |
| Weighted residual factors for all reflections included in the refinement | 0.0516 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.405 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4083826.html
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