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Information card for entry 4084423
Preview
| Coordinates | 4084423.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Compound8 |
|---|---|
| Formula | C27 H50 Ni O P |
| Calculated formula | C27 H50 Ni O P |
| SMILES | [C]12(=O)[C]3(=[CH]4[C]5(=[CH]6C1(C(C)(C)C)[Ni]23456[P](C(C)(C)C)(C(C)(C)C)C(C)(C)C)C)C(C)(C)C |
| Title of publication | Useful Method for the Preparation of Low-Coordinate Nickel(I) Complexes via Transformations of the Ni(I) Bis(amido) Complex K{Ni[N(SiMe3)(2,6- (i) Pr2-C6H3)]2} |
| Authors of publication | Lipschutz, Michael I.; Tilley, T. Don |
| Journal of publication | Organometallics |
| Year of publication | 2014 |
| Journal volume | 33 |
| Journal issue | 19 |
| Pages of publication | 5566 - 5570 |
| a | 9.7648 ± 0.0007 Å |
| b | 16.4415 ± 0.0012 Å |
| c | 16.7346 ± 0.0012 Å |
| α | 90° |
| β | 103.794 ± 0.003° |
| γ | 90° |
| Cell volume | 2609.2 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0264 |
| Residual factor for significantly intense reflections | 0.0231 |
| Weighted residual factors for significantly intense reflections | 0.0571 |
| Weighted residual factors for all reflections included in the refinement | 0.059 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4084423.html
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Users of the data should acknowledge the original authors of the
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