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Information card for entry 4084425
Preview
| Coordinates | 4084425.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H24 Cl N3 Ni O2 |
|---|---|
| Calculated formula | C30 H24 Cl N3 Ni O2 |
| SMILES | [Ni]12([N]3=C(c4c(N2c2c(C5=[N]1[C@@H](c1ccccc1)CO5)cccc2)cccc4)OC[C@@H]3c1ccccc1)Cl |
| Title of publication | Chiral Palladium(II) and Nickel(II) Complexes withC2-Symmetrical Tridentate Bis(oxazoline) Ligands: Synthesis, Characterization, and Catalytic Norbornene Polymerization |
| Authors of publication | He, Jianyun; Liu, Zhanxiong; Du, Gaixia; Fu, Yinxia; Zhang, Shaowen; Li, Xiaofang |
| Journal of publication | Organometallics |
| Year of publication | 2014 |
| Journal volume | 33 |
| Journal issue | 21 |
| Pages of publication | 6103 |
| a | 9.2393 ± 0.0007 Å |
| b | 14.5649 ± 0.0014 Å |
| c | 19.245 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2589.8 ± 0.5 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.1087 |
| Residual factor for significantly intense reflections | 0.0616 |
| Weighted residual factors for significantly intense reflections | 0.0893 |
| Weighted residual factors for all reflections included in the refinement | 0.1056 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.008 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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