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Information card for entry 4084480
Preview
| Coordinates | 4084480.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H37 Cl Co N2 P2 |
|---|---|
| Calculated formula | C20 H37 Cl Co N2 P2 |
| SMILES | [Co]12(Cl)[P](N(c3c2c(N([P]1(C(C)C)C(C)C)C)ccc3)C)(C(C)C)C(C)C |
| Title of publication | Synthesis and Reactivity of Four- and Five-Coordinate Low-Spin Cobalt(II) PCP Pincer Complexes and Some Nickel(II) Analogues |
| Authors of publication | Murugesan, Sathiyamoorthy; Stöger, Berthold; Carvalho, Maria Deus; Ferreira, Liliana P.; Pittenauer, Ernst; Allmaier, Günter; Veiros, Luis F.; Kirchner, Karl |
| Journal of publication | Organometallics |
| Year of publication | 2014 |
| Pages of publication | 141009125933001 |
| a | 14.566 ± 0.003 Å |
| b | 11.279 ± 0.002 Å |
| c | 14.64 ± 0.003 Å |
| α | 90° |
| β | 105.829 ± 0.005° |
| γ | 90° |
| Cell volume | 2314 ± 0.8 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 7 |
| Hermann-Mauguin space group symbol | P 1 c 1 |
| Hall space group symbol | P -2yc |
| Residual factor for all reflections | 0.0631 |
| Residual factor for significantly intense reflections | 0.0499 |
| Weighted residual factors for significantly intense reflections | 0.072 |
| Weighted residual factors for all reflections included in the refinement | 0.0743 |
| Goodness-of-fit parameter for significantly intense reflections | 1.47 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.39 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4084480.html
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Users of the data should acknowledge the original authors of the
structural data.