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Information card for entry 4084637
Preview
| Coordinates | 4084637.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H30 Cl2 O2 Si2 Sn2 |
|---|---|
| Calculated formula | C36 H30 Cl2 O2 Si2 Sn2 |
| SMILES | [Sn]1(Cl)[O]([Sn](Cl)[O]1[Si](c1ccccc1)(c1ccccc1)c1ccccc1)[Si](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Structure vs119Sn NMR Chemical Shift in Three-Coordinated Tin(II) Complexes: Experimental Data and Predictive DFT Computations |
| Authors of publication | Wang, Lingfang; Kefalidis, Christos E.; Roisnel, Thierry; Sinbandhit, Sourisak; Maron, Laurent; Carpentier, Jean-François; Sarazin, Yann |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 11 |
| Pages of publication | 2139 |
| a | 9.8651 ± 0.0002 Å |
| b | 12.6482 ± 0.0003 Å |
| c | 14.6314 ± 0.0003 Å |
| α | 94.749 ± 0.001° |
| β | 104.798 ± 0.001° |
| γ | 105.615 ± 0.001° |
| Cell volume | 1677.28 ± 0.06 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0204 |
| Residual factor for significantly intense reflections | 0.0193 |
| Weighted residual factors for significantly intense reflections | 0.0462 |
| Weighted residual factors for all reflections included in the refinement | 0.047 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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