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Information card for entry 4085185
Preview
| Coordinates | 4085185.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H28 Li N O2 Si |
|---|---|
| Calculated formula | C14 H28 Li N O2 Si |
| SMILES | [Si]1(C2[CH](=CC=C)[Li]342[O](CC[N]4(C1)CC[O]3C)C)(C)C |
| Title of publication | Directed Lithiation of Pentadienylsilanes |
| Authors of publication | Day, Benjamin M.; McDouall, Joseph J. W.; Clayden, Jonathan; Layfield, Richard A. |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 11 |
| Pages of publication | 2348 |
| a | 7.6101 ± 0.0003 Å |
| b | 8.4731 ± 0.0004 Å |
| c | 14.0204 ± 0.0007 Å |
| α | 85.418 ± 0.004° |
| β | 78.953 ± 0.004° |
| γ | 80.657 ± 0.004° |
| Cell volume | 874.42 ± 0.07 Å3 |
| Cell temperature | 150.03 ± 0.1 K |
| Ambient diffraction temperature | 150.03 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0773 |
| Residual factor for significantly intense reflections | 0.0565 |
| Weighted residual factors for significantly intense reflections | 0.1358 |
| Weighted residual factors for all reflections included in the refinement | 0.1487 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4085185.html
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Users of the data should acknowledge the original authors of the
structural data.